A critical thickness condition for a strained compliant substrate/epitaxial film system

Applied Physics Letters

Volumn 69, Issue 2, 1996, Pages 173-175

  Freund, L B ^a   Nix, M W D ^b  

^a Brown University   (United States)

^b Stanford University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001057599     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117362     Document Type: Article

References (13)

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