Numerical simulation of interface crack in thin films

International Journal of Fracture

Volumn 98, Issue 3-4, 1999, Pages 195-207

  Varias, A G ^a   Mastorakos, I ^b   Aifantis, E C ^b  

^a Solid Mechanics Research Office   (Greece)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Crack growth; Damage growth; de adhesion; Interface crack; Interface damage; Thin film

Indexed keywords

ADHESION; BUCKLING; COMPRESSIVE STRESS; CRACK PROPAGATION; FAILURE ANALYSIS; FILM GROWTH; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); SUBSTRATES; THIN FILMS;

BIMATERIAL FAILURE; DAMAGE GROWTH; DE-ADHESION; INTERFACE CRACK;

MICROCRACKS;

EID: 0033342907     PISSN: 03769429     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1018326728621     Document Type: Article

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