Discrete and continuous deformation during nanoindentation of thin films

Acta Materialia

Volumn 48, Issue 9, 2000, Pages 2277-2295

  Gouldstone, A ^a   Koh, H J ^a,b   Zeng, K Y ^a,c   Giannakopoulos, A E ^a   Suresh, S ^a  

^a USA   (United States)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

Dislocations; Mechanical properties; Nanoindentation; Theory and experiments; Thin films

Indexed keywords

EID: 0000849964     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(00)00009-4     Document Type: Article

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