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Volumn 48, Issue 6, 2000, Pages 1107-1131

Crack patterns in thin films

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELASTICITY; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; RESIDUAL STRESSES; SUBSTRATES; TENSILE STRESS; TENSILE TESTING; THIN FILMS;

EID: 0033879864     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-5096(99)00081-2     Document Type: Article
Times cited : (363)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.