Interfaces and stresses in thin films

Acta Materialia

Volumn 48, Issue 1, 2000, Pages 31-42

  Spaepen, F ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT; POLYCRYSTALLINE MATERIALS; SURFACE MEASUREMENT; SURFACE PHENOMENA; TENSILE STRESS; VAPOR DEPOSITION;

IN SITU CURVATURE MEASUREMENT; INTERFACE STRESSES; INTRINSIC STRESSES; PHYSICAL VAPOR DEPOSITION;

THIN FILMS;

EID: 0033874950     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00286-4     Document Type: Article

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