Assessment of thin-film hardness through elastic/plastic stress analysis in a microindentation test

Journal of Applied Physics

Volumn 82, Issue 7, 1997, Pages 3266-3274

  Ahn, Jeong Hoon ^a   Kwon, Dongil ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001645234     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365633     Document Type: Article

References (28)

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