Misfit dislocation patterning in thin films

Physica Status Solidi (B) Basic Research

Volumn 209, Issue 2, 1998, Pages 295-304

  Cholevas, K ^a   Liosatos, N ^b   Romanov, A E ^c   Zaiser, M ^b,d   Aifantis, E C ^a,b  

^a MICHIGAN TECHNOLOGICAL UNIVERSITY   (United States)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c IOFFE INSTITUTE   (Russian Federation)

^d MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032327553     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199810)209:2<295::AID-PSSB295>3.0.CO;2-9     Document Type: Article

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