Measuring interface parameters and toughness - A computational study

Acta Materialia

Volumn 49, Issue 5, 2001, Pages 817-825

  Liu, P ^a,c   Cheng, L ^a   Zhang, Y W ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^c INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

Interface; Thin films; Toughness

Indexed keywords

EID: 0037897854     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(00)00374-8     Document Type: Article

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