Nanoscopic hardness measurement by atomic force microscope

JSME International Journal, Series A: Mechanics and Material Engineering

Volumn 39, Issue 3, 1996, Pages 456-462

  Nagashima, Nobuo ^a   Matsuoka, Saburo ^a   Miyahara, Kensuke ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Atomic Force Microscope; Atomic Scale Imaging; Hardness Measurement; Nanofabrication; S 25 C Steel; SNCM 439 Steel

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON STEEL; NANOTECHNOLOGY; STEEL;

ATOMIC SCALE IMAGING; CANTILEVER; NANOINDENTATION TECHNIQUE; THREE SIDED PYRAMIDAL DIAMOND TIP;

HARDNESS;

EID: 0030194322     PISSN: 13408046     EISSN: None     Source Type: Journal    
DOI: 10.1299/jsmea1993.39.3_456     Document Type: Article

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