Robust output high-gain feedback controllers for the atomic force microscope under high data sampling rate

IEEE Conference on Control Applications - Proceedings

Volumn 2, Issue , 1999, Pages 1626-1631

  Hsu, Su Hau ^a   Fu, Li Chen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CONTROL SYSTEM ANALYSIS; CONTROL SYSTEM SYNTHESIS; DATA REDUCTION; LINEARIZATION; MATHEMATICAL MODELS; PERTURBATION TECHNIQUES; ROBUSTNESS (CONTROL SYSTEMS);

CANTILEVER-SAMPLE SYSTEM;

FEEDBACK CONTROL;

EID: 0033355805     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)