-
1
-
-
0012618901
-
Atomic Force Microscope
-
Binning, G., Quate, C. F., and Gerber, Ch., 1986, “Atomic Force Microscope,” Phys. Rev. Lett., 56, pp. 930-933.
-
(1986)
Phys. Rev. Lett.
, vol.56
, pp. 930-933
-
-
Binning, G.1
Quate, C.F.2
Gerber, C.3
-
2
-
-
4243137092
-
An Atomic-Resolution Atomic-Force Microscope Implemented Using an Optical Lever
-
Alexander, S., Hellemans, L., Marti, O., Schneri, J., Elings, V, Hansma, P. K., Longmire, M., and Gurely, J., 1989, “An Atomic-Resolution Atomic-Force Microscope Implemented Using an Optical Lever,” J. Appl. Phys., 65, pp. 164-167.
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 164-167
-
-
Alexander, S.1
Hellemans, L.2
Marti, O.3
Schneri, J.4
Elings, V.5
Hansma, P.K.6
Longmire, M.7
Gurely, J.8
-
3
-
-
0028336158
-
Piezoelectric Sensor for Detecting Force Gradients in Atomic Force Microscopy
-
Itoh, T., and Suga, T., 1994, “Piezoelectric Sensor for Detecting Force Gradients in Atomic Force Microscopy,” Jpn. J. Appl. Phys., Part 1, 33, pp. 334-340.
-
(1994)
Jpn. J. Appl. Phys., Part 1
, vol.33
, pp. 334-340
-
-
Itoh, T.1
Suga, T.2
-
4
-
-
0028426819
-
Piezoelectric Force Sensor for Scanning Force Microscopy
-
Itoh, T., and Suga, T., 1994, “Piezoelectric Force Sensor for Scanning Force Microscopy,” Sens. Actuators A, 43, pp. 305-310.
-
(1994)
Sens. Actuators A
, vol.43
, pp. 305-310
-
-
Itoh, T.1
Suga, T.2
-
5
-
-
0001146439
-
Self-Excited Force-Sensing Microcantilevers with Piezoelectric Thin Films for Dynamic Scanning Force Microscopy
-
Itoh, T., and Suga, T., 1996, “Self-Excited Force-Sensing Microcantilevers with Piezoelectric Thin Films for Dynamic Scanning Force Microscopy,” Sens. Actuators A, 54, pp. 477-481.
-
(1996)
Sens. Actuators A
, vol.54
, pp. 477-481
-
-
Itoh, T.1
Suga, T.2
-
6
-
-
0012342125
-
Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes
-
Basso, M., Giarre, L., Dahleh, M., and Mezic, I., 2000, “Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes,” ASME J. Dyn. Syst., Meas., Control, 122, pp. 240-245.
-
(2000)
ASME J. Dyn. Syst., Meas., Control
, vol.122
, pp. 240-245
-
-
Basso, M.1
Giarre, L.2
Dahleh, M.3
Mezic, I.4
-
7
-
-
0032598751
-
Dynamical Analysis and Control of Microcantilever
-
Ashhab, M., Salapaka, M. V., Dahleh, M., and Mezic, I., 1999, “Dynamical Analysis and Control of Microcantilever,” Automatica, 35, pp. 1663-1670.
-
(1999)
Automatica
, vol.35
, pp. 1663-1670
-
-
Ashhab, M.1
Salapaka, M.V.2
Dahleh, M.3
Mezic, I.4
-
9
-
-
0033153911
-
Force-Distance Curve by Atomic Force Microscopy
-
Cappella, B., and Dietler, G., 1999, “Force-Distance Curve by Atomic Force Microscopy,” Surf. Sci. Rep., 34, pp. 1-104.
-
(1999)
Surf. Sci. Rep.
, vol.34
, pp. 1-104
-
-
Cappella, B.1
Dietler, G.2
-
10
-
-
0034226534
-
Dynamic Analysis of a Piezothermoelastic Resonator with Various Shapes
-
Fung, R. F., Huang, J. S., and Jan, S. C., 2000, “Dynamic Analysis of a Piezothermoelastic Resonator with Various Shapes,” ASME J. Vibr. Acoust., 122, pp. 244-253.
-
(2000)
ASME J. Vibr. Acoust.
, vol.122
, pp. 244-253
-
-
Fung, R.F.1
Huang, J.S.2
Jan, S.C.3
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