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Volumn 16, Issue 2, 2001, Pages 437-445
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Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ATOMIC FORCE MICROSCOPY;
CARBON;
COMPUTER SOFTWARE;
DATA ACQUISITION;
FRICTION;
LOADS (FORCES);
ULTRATHIN HARD AMORPHOUS CARBON COATINGS;
PROTECTIVE COATINGS;
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EID: 0035262037
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2001.0066 Document Type: Article |
Times cited : (68)
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References (25)
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