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Volumn 16, Issue 2, 2001, Pages 437-445

Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CARBON; COMPUTER SOFTWARE; DATA ACQUISITION; FRICTION; LOADS (FORCES);

EID: 0035262037     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2001.0066     Document Type: Article
Times cited : (68)

References (25)
  • 8
    • 0009276179 scopus 로고
    • Thin Films: Stresses and Mechanical Properties II, edited by M.F. Doerner, W.C. Oliver, G.M. Pharr, and F.R. Brotzen (Pittsburgh, PA)
    • (1990) Mater. Res. Soc. Symp. Proc. , vol.188 , pp. 191-205
    • Wu, T.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.