Active interaction force identification for atomic force microscope applications

Proceedings of the IEEE Conference on Decision and Control

Volumn 4, Issue , 2002, Pages 3678-3683

  Fang, Y ^a   Feemster, M ^a   Dawson, D ^a   Jalili, N ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMPTOTIC STABILITY; ATOMIC FORCE MICROSCOPY; DISTRIBUTED PARAMETER CONTROL SYSTEMS; IMAGING TECHNIQUES; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; ORDINARY DIFFERENTIAL EQUATIONS; SET THEORY; SYSTEM STABILITY; TIME VARYING SYSTEMS;

ACTIVE INTERACTION FORCE IDENTIFICATION; ASYMPTOTIC IDENTIFICATION; ATOMIC RESOLUTION IMAGES; DISTRIBUTED BASED MODELING APPROACH; MOLECULAR IMAGING;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 0036996807     PISSN: 01912216     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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