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International Materials Reviews

Volumn 49, Issue 2, 2004, Pages 109-122

Imaging and analysis in materials science by low vacuum scanning electron microscopy

(1) Thiel, B L a,b

a STATE UNIVERSITY OF NEW YORK (United States)

b UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

Analysis; Electronic materials; Environmental SEM; Imaging; Low vacuum SEM; Scanning electron microscopy

Indexed keywords

DEFECTS; DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; ELECTRONIC PROPERTIES; ELECTRONICS INDUSTRY; EMULSIONS; IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; THERMODYNAMIC PROPERTIES;

CHARGE STABILIZATION; ELECTRONIC MATERIALS; ENVIRONMENTAL SEM; LOW VACUUM SEM;

MATERIALS SCIENCE;

EID: 3042538247 PISSN: 09506608 EISSN: None Source Type: Journal
DOI: 10.1179/095066004225019191 Document Type: Review

Times cited : (7)

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