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Volumn 19, Issue 2, 1997, Pages 75-78
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A new correction method for high-resolution energy-dispersive x-ray analyses in the environmental scanning electron microscope
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Author keywords
Correction method; Electron skin; Environmental scanning electron microscope; X ray analysis
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Indexed keywords
ANALYTIC METHOD;
ARTICLE;
CALIBRATION;
ELECTRON BEAM;
ELECTRON RADIATION;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
X RAY MICROANALYSIS;
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EID: 0031396343
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950190203 Document Type: Article |
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Times cited : (45)
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References (6)
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