Imaging charge trap distributions in GaN using environmental scanning electron microscopy

Applied Physics Letters

Volumn 77, Issue 9, 2000, Pages 1342-1344

  Toth, M ^a   Kucheyev, S O ^b   Williams, J S ^b   Jagadish, C ^b   Phillips, M R ^a   Li, G ^c  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001757260     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1290267     Document Type: Article

References (11)

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