Some aspects of optimizing contrasts for the investigation of joint materials in the environmental scanning electron microscope

Scanning

Volumn 19, Issue 2, 1997, Pages 79-84

  Schnarr, Holger ^a   Fütting, Manfred W ^a  

^a FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

Author keywords

Contrast phenomena; Environmental scanning electron microscopy; Joint materials

Indexed keywords

ANALYTIC METHOD; ARTICLE; ATOMIC PARTICLE; ELECTRIC CONDUCTIVITY; ELECTRON BEAM; ELECTRON RADIATION; GAS ANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0031402919     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950190204     Document Type: Article

References (4)

1. Danilatos GD: Theory of the gaseous detector device in the ESEM. Adv Electronics Electron Phys 78, 1-102 (1990)
2. Hopfe J, Füting M: Fundamentals and applications of environmental scanning electron microscopy. In In Situ Scanning Electron Microscopy in Materials Research (1st ed.) (Eds. Wetzig K, Schulze D). Akademie Verlag, Berlin (1995) 219-239
3. Rask JH, Flood JE, Borchardt JK, York GA: The ESEM used to image crystalline structures of polymers and to ink on paper. Microsc Res Techn 25,384-392(1993)
4. Rask JH, Flood JE, Füting M, Pohlenz D: Unexpected secondary electron imaging contrast at low levels with the environmental scanning electron microscope (ESEM). Abstracts of the Regio Surface Freiburg' 95, 18 (1995)