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Volumn 22, Issue 4, 2000, Pages 234-242

Charge contrast imaging of material growth and defects in environmental scanning electron miscroscopy - Linking electron emission and cathodoluminescence

Author keywords

Cathodoluminescence; Charge contrast imaging; Environmental scanning electron microscopy; Mineralogy; Scanning electron microscopy

Indexed keywords

ARTICLE; CONTRAST ENHANCEMENT; ELECTRIC FIELD; ELECTRON TRANSPORT; IMAGE ENHANCEMENT; LUMINESCENCE; MATERIALS TESTING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0034487090     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950220402     Document Type: Article
Times cited : (56)

References (25)
  • 8
    • 22444455688 scopus 로고    scopus 로고
    • Charge contrast: Some ESEM observations of a new/old phenomenon
    • (1998) Microsc Microanal , vol.4 , Issue.2 s , pp. 292-293
    • Doehne, E.1
  • 14
    • 23044522601 scopus 로고    scopus 로고
    • A new mechanism for the imaging of crystal structure in non-conductive materials: An application of charge-induced contrast in the environmental scanning electron microscope (ESEM)
    • (1997) Microsc Microanal , vol.3 , Issue.2 s , pp. 1197-1198
    • Griffin, B.J.1
  • 16
    • 0006161373 scopus 로고    scopus 로고
    • Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators - Implications for electron imaging and x-ray microanalysis
    • (Eds. Bailey GW, Corbett JM, Dimlich RVW, Michael JR, Zalusec NJ)
    • (1996) Proc Microscopy Microanalysis 1996 , pp. 436-441
    • Griffin, B.J.1    Nockolds, C.E.2
  • 21
    • 4244127612 scopus 로고
    • Scanning electron microscopy at elevated pressure: A newcomer's views
    • (1995) Scanning , vol.17
    • Newbury, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.