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Volumn 22, Issue 4, 2000, Pages 234-242
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Charge contrast imaging of material growth and defects in environmental scanning electron miscroscopy - Linking electron emission and cathodoluminescence
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Author keywords
Cathodoluminescence; Charge contrast imaging; Environmental scanning electron microscopy; Mineralogy; Scanning electron microscopy
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Indexed keywords
ARTICLE;
CONTRAST ENHANCEMENT;
ELECTRIC FIELD;
ELECTRON TRANSPORT;
IMAGE ENHANCEMENT;
LUMINESCENCE;
MATERIALS TESTING;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
CHARGE CONTRAST IMAGING (CCI);
ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY (ESEM);
CATHODOLUMINESCENCE;
CRYSTAL DEFECTS;
CRYSTAL GROWTH;
ELECTRON BEAMS;
ELECTRON EMISSION;
IMAGING TECHNIQUES;
MINERALOGY;
SCANNING ELECTRON MICROSCOPY;
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EID: 0034487090
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950220402 Document Type: Article |
Times cited : (56)
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References (25)
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