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Volumn 405, Issue 1-2, 2002, Pages 1-10

Structural characterization of TiO2 films obtained by high temperature oxidation of TiC single crystals

Author keywords

Growth mechanism; Titanium carbide; Titanium oxide; X Ray texture

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; HIGH TEMPERATURE EFFECTS; OXIDATION; RATE CONSTANTS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; TITANIUM CARBIDE; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS;

EID: 0037154903     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01725-4     Document Type: Article
Times cited : (19)

References (17)
  • 9
    • 84995725902 scopus 로고    scopus 로고
    • International Center for Diffraction Data, Power Diffraction File 2, data base JCPDS CARD=21-1276


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.