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Volumn 405, Issue 1-2, 2002, Pages 1-10
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Structural characterization of TiO2 films obtained by high temperature oxidation of TiC single crystals
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Author keywords
Growth mechanism; Titanium carbide; Titanium oxide; X Ray texture
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
HIGH TEMPERATURE EFFECTS;
OXIDATION;
RATE CONSTANTS;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
SUBSTRATES;
TITANIUM CARBIDE;
TITANIUM OXIDES;
X RAY DIFFRACTION ANALYSIS;
GROWTH MECHANISM;
STRUCTURAL CHARACTERIZATION;
THIN FILMS;
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EID: 0037154903
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01725-4 Document Type: Article |
Times cited : (19)
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References (17)
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