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Volumn 6, Issue 1, 2000, Pages 49-58

Correlation between charge contrast imaging and the distribution of some trace level impurities in gibbsite

Author keywords

Charge contrast imaging; Environmental scanning electron microscope; Gibbsite; Monte Carlo simulations; Wavelength dispersive spectrometry x ray mapping

Indexed keywords


EID: 0003089578     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927600000088     Document Type: Article
Times cited : (27)

References (30)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.