Some theoretical considerations on X-ray microanalysis in the environmental or variable pressure scanning electron microscope

Scanning

Volumn 21, Issue 6, 1999, Pages 388-393

  Gauvin, Raynald ^a  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

Author keywords

Elastic scattering; Gas; Scanning electron microscopy; X ray microanalysis

Indexed keywords

ARTICLE; LABORATORY; PRESSURE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STANDARDIZATION; THEORY; X RAY MICROANALYSIS;

EID: 0033371081     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950210605     Document Type: Article

References (4)

1. Doehne E: A new correction method for high-resolution energy-dispersive x-ray analyses in the environmental scanning electron microscope. Scanning 19, 75-78 (1997)
2. Gauvin R, Drouin D: A formula to compute total elastic Mott cross-sections. Scanning 15, 140-150 (1993)
3. Mansfield JF: X-Ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction? Book of abstracts of the EMAS'99 6th European Workshop on Modern Developments and Applications in Microbeam Analysis, held in Konstanz, Germany, May 3 to 7, 69-84 (1993)
4. Murata K, Yasuda M, Kawata H: Effect of the introduction of the discrete energy loss process into Monte Carlo simulation of electron scattering. Scanning 17, 228-234 (1995)