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Journal of Physics D: Applied Physics

Volumn 35, Issue 14, 2002, Pages 1796-1804

Quantification of electron-ion recombination in an electron-beam-irradiated gas capacitor

(4) Toth, M a Daniels, D R a Thiel, B L a Donald, A M a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; ELECTRIC CURRENTS; ELECTRON BEAMS; ELECTRON IRRADIATION; GASES; IONS; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION;

GAS CAPACITORS;

CAPACITORS;

EID: 0037151218 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/35/14/322 Document Type: Article

Times cited : (20)

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