-
4
-
-
0000361770
-
-
A. Shih, J. Yater, P. Pehrsson, J. Butler, C. Hor, and R. Abrams, J. Appl. Phys. 82, 1860 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 1860
-
-
Shih, A.1
Yater, J.2
Pehrsson, P.3
Butler, J.4
Hor, C.5
Abrams, R.6
-
9
-
-
35848945426
-
-
Particle Induced Electron Emission, Springer, Berlin
-
J. Devooght, J. C. Dehaes, A. Dubus, M. Cailler, and J. P. Ganachaud, in Particle Induced Electron Emission, Springer Tracts in Modern Physics Vol. 122 (Springer, Berlin, 1991), p. 62.
-
(1991)
Springer Tracts in Modern Physics
, vol.122
, pp. 62
-
-
Devooght, J.1
Dehaes, J.C.2
Dubus, A.3
Cailler, M.4
Ganachaud, J.P.5
-
10
-
-
0001438791
-
-
A. Akkerman, T. Boutboul, A. Breskin, R. Check, and A. Gibrekhtman, J. Appl. Phys. 76, 4656 (1994).
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 4656
-
-
Akkerman, A.1
Boutboul, T.2
Breskin, A.3
Check, R.4
Gibrekhtman, A.5
-
11
-
-
0000994926
-
-
Ionization of Solids by Heavy Particles, edited by R. A. Baragiola Plenum, New York
-
J. Cazaux, in Ionization of Solids by Heavy Particles, NATO ASI Series B 306 Physics, edited by R. A. Baragiola (Plenum, New York, 1993), p. 325.
-
(1993)
NATO ASI Series B 306 Physics
, pp. 325
-
-
Cazaux, J.1
-
13
-
-
0000292035
-
-
C. Le Gressus, F. Valin, H. Henriot, M. Gauthier, J. P. Duraud, T. S. Sudarshan, R. G. Bommakanti, and G. Blaise, J. Appl. Phys. 69, 6325 (1991).
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 6325
-
-
Le Gressus, C.1
Valin, F.2
Henriot, H.3
Gauthier, M.4
Duraud, J.P.5
Sudarshan, T.S.6
Bommakanti, R.G.7
Blaise, G.8
-
17
-
-
0002003383
-
-
edited by K. F. J. Heinrich and D. E. Newbury Plenum, New York
-
G. F. Bastin and H. J. M. Heijligers, in Electron Probe Quantification, edited by K. F. J. Heinrich and D. E. Newbury (Plenum, New York, 1991), p. 193.
-
(1991)
Electron Probe Quantification
, pp. 193
-
-
Bastin, G.F.1
Heijligers, H.J.M.2
-
19
-
-
0002712026
-
-
Stuttgart
-
L. Reimer, V. Golla, R. Böngeler, M. Kässens, M. Schindler, and R. Senkel, Optik (Stuttgart) 92, 14 (1992).
-
(1992)
Optik
, vol.92
, pp. 14
-
-
Reimer, L.1
Golla, V.2
Böngeler, R.3
Kässens, M.4
Schindler, M.5
Senkel, R.6
-
21
-
-
0001084342
-
-
J. Cazaux, K. H. Kim, O. Jbara, and G. Salace, J. Appl. Phys. 70, 960 (1991).
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 960
-
-
Cazaux, J.1
Kim, K.H.2
Jbara, O.3
Salace, G.4
-
23
-
-
0026712101
-
-
M. Szymonski, A. Poradzisz, P. Czuba, J. Kolodziez, P. Piatkowski, J. Fine, L. Tanovic, and N. Tanovic, Surf. Sci. 260, 295 (1992).
-
(1992)
Surf. Sci.
, vol.260
, pp. 295
-
-
Szymonski, M.1
Poradzisz, A.2
Czuba, P.3
Kolodziez, J.4
Piatkowski, P.5
Fine, J.6
Tanovic, L.7
Tanovic, N.8
-
25
-
-
0031621887
-
-
edited by G. Damammme, Tours, France, June 1998 Société Française du Vide, Paris, Le Vide
-
Y. Saito, S. Michizono, T. Sato, S. Kobayashi, and C. Jardin, in Proceedings of the 3rd International Conference on Electric Charge in Solid Insulators, edited by G. Damammme, Tours, France, June 1998 (Socié té Française du Vide, Paris, Le Vide, 1998), Vol. 287, p. 382.
-
(1998)
Proceedings of the 3rd International Conference on Electric Charge in Solid Insulators
, vol.287
, pp. 382
-
-
Saito, Y.1
Michizono, S.2
Sato, T.3
Kobayashi, S.4
Jardin, C.5
-
28
-
-
0043023820
-
-
Scanning Electron Microscopy, edited by L. Reimer Spring, Berlin
-
L. Reimer, in Scanning Electron Microscopy, Springer Series in Optical Sciences 45, edited by L. Reimer (Spring, Berlin, 1985), p. 117.
-
(1985)
Springer Series in Optical Sciences
, vol.45
, pp. 117
-
-
Reimer, L.1
-
29
-
-
0041877009
-
-
O. Jbara, J. Cazaux, G. Remond, and C. Gilles, J. Appl. Phys. 79, 2309 (1996).
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 2309
-
-
Jbara, O.1
Cazaux, J.2
Remond, G.3
Gilles, C.4
-
33
-
-
0347135328
-
-
edited by T. P. Ma and P. V. Dressendorfer Wiley, New York
-
F. B. Mc Lean, H. E. Boesch, and T. R. Oldham, in Ionizing Radiation Effects in MOS Devices and Circuits, edited by T. P. Ma and P. V. Dressendorfer (Wiley, New York, 1989), p. 89.
-
(1989)
Ionizing Radiation Effects in MOS Devices and Circuits
, pp. 89
-
-
Mc Lean, F.B.1
Boesch, H.E.2
Oldham, T.R.3
-
34
-
-
35848952456
-
-
Antibes, France, April (Societè Francaise du Vide, Paris), Supplement to Le Vide: Science Technique et Applications
-
P. Durupt, M. Ghamnia, and C. Jardin, in Proceedings of the 2nd International Conference on Space Charge in Solid Dielectrics, Antibes, France, April 1995 (Societè Francaise du Vide, Paris), Supplement to Le Vide: Science Technique et Applications, Vol. 275, p. 264.
-
(1995)
Proceedings of the 2nd International Conference on Space Charge in Solid Dielectrics
, vol.275
, pp. 264
-
-
Durupt, P.1
Ghamnia, M.2
Jardin, C.3
-
35
-
-
0001463451
-
-
edited by G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. Mc Carthy, and T. P. Pretlow Springer, Cleveland, Ohio
-
B. J. Griffin, Proceedings of Microscopy and Analysis 1997, edited by G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. Mc Carthy, and T. P. Pretlow (Springer, Cleveland, Ohio, 1997), p. 1197.
-
(1997)
Proceedings of Microscopy and Analysis 1997
, pp. 1197
-
-
Griffin, B.J.1
-
38
-
-
35848930303
-
-
S. Ichimura, H. Nonaka, A. Kurokawa, and K. Nakamura, in Ref. 25, p. 100
-
S. Ichimura, H. Nonaka, A. Kurokawa, and K. Nakamura, in Ref. 25, p. 100.
-
-
-
-
39
-
-
0026838469
-
-
G. Remond, F. Cesbron, R. Chapoulie, D. Ohnenstretter, C. RoquesCarmes, and M. Shvoerer, Scanning Microsc. 6, 23 (1992).
-
(1992)
Scanning Microsc.
, vol.6
, pp. 23
-
-
Remond, G.1
Cesbron, F.2
Chapoulie, R.3
Ohnenstretter, D.4
Roquescarmes, C.5
Shvoerer, M.6
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