Time-dependent measurement of the trapped charge in electron irradiated insulators: Application to Al2O3-sapphire

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 2289-2294

  Belhaj, M ^a   Odof, S ^a   Msellak, K ^a   Jbara, O ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000354850     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287131     Document Type: Article

References (28)

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