Picometer accuracy in measuring lattice displacements across planar faults by interferometry in coherent electron diffraction

Physical Review Letters

Volumn 85, Issue 24, 2000, Pages 5126-5129

  Wu, Lijun ^a   Zhu, Yimei ^a   Tafto, J ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL LATTICES; ELECTRON DIFFRACTION; ELECTRON SOURCES; IMAGING TECHNIQUES; INTERCALATION COMPOUNDS; INTERFEROMETRY; MICROSCOPES; STACKING FAULTS; VECTORS;

COHERENT ELECTRON DIFFRACTION; LATTICE DISPLACEMENTS; PICOMETER; PLANAR FAULTS;

OXIDE SUPERCONDUCTORS;

EID: 0034429396     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.5126     Document Type: Article

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