Environmental high resolution electron microscopy of gas-catalyst reactions

Topics in Catalysis

Volumn 8, Issue 1-2, 1999, Pages 97-113

  Gai, Pratibha L ^a,b  

^a DUPONT COMPANY   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

Alkanes; Environmental electron microscopy; Heterogeneous gas catalyst reactions; Nanotubes

Indexed keywords

EID: 0033440357     PISSN: 10225528     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1019192523483     Document Type: Article

References (52)

1. P.B. Hirsch, A. Howie, D. Pashley, R. Nicholson and M. Whelan, EM of Thin Crystals (Krieger, FL, 1965 and 1975).
2. (a) J.M. Cowley, Diffraction Physics (North-Holland, Amsterdam, 1981);
3. (b) D. Hull, Introduction to Dislocations (Pergamon Press, 1965).
4. (a) J.M. Thomas, Phil. Trans. Roy. Soc. A 277 (1974) 251;
5. (b) P.L. Gai et al., Nature (London) 348 (1990) 430.
6. (a) P.L. Gai and J.M. Thomas, Nanostr. Chemistry, Supcond. Review 1 (1992) 1;
7. (b) S. Amelinkx et al., eds., Microscopy (Wiley-VCH, Weinheim, 1996).
8. E.P. Butler and K.F. Hale, Dynamic Experiments (North-Holland, Amsterdam, 1981).
9. H. Hashimoto, T. Naiki, T. Eto and K. Fujiwara, Jpn. J. Appl. Phys. 7 (1968) 946.
10. P.R. Swann and N.J. Tighe, Jernkont. Ann. 155 (1971) 251.
11. H. Fujita, ed., In-Situ Experiments (Osaka Univ. Press, Osaka, 1985).
12. K.H. Westamacott and U. Dahmen, Decomposition of Alloys, eds. R Haasen et al. (Pergamon Press, Oxford, 1984) p. 204.
13. R.T.K. Baker, Catal. Rev. Sci. Eng. 19 (1979) 161.
14. P.L. Gai, Phil. Mag. (London) (1976); Phil. Mag. 43 (1981) 841.
15. P.L. Gai, Phil. Mag. (London) (1976); Phil. Mag. 43 (1981) 841.
16. P.L. Gai, Catal. Rev. Sci. & Engg. 34 (1992) 1.
17. T. Nakayama, T. Arai and Y. Nishiyama, J. Catal. 87 (1984) 108.
18. E. Ruckenstein and S. Lee, J. Catal. 86 (1984) 457.
19. F.S. Stone, J. Solid. St. Chem. 12 (1975) 271.
20. J. Haber, J. Janas, M. Shiavello and R.J.D. Tilley, J. Catal. 82 (1983) 395.
21. R.C. Doole, M. Parkinson and J.M. Steed, Inst. of Phys. Conf. Ser. 119 (1991) 157.
22. T.C. Lee, D. Dewald, J. Eades, I.M. Robertson and H.K. Birnbaum, Rev. Sci. Instr. 62 (1991) 1438.
23. R. Sharma, K. Weiss, M. McKelvey and G. Glausinger, in: Proc. Micr. Soc. Am., 1994, p. 494.
24. J. Haggin, Am. Chem. Soc. - Chem & Eng. News 7 (1995) 39.
25. P.L. Gai and E.D. Boyes, MRS Bulletin 3 (1995) 17; in: Proc. Mater. Res. Soc., Vol. 404, Mat. Res. Soc. Publ. (1996).
26. P.L. Gai and E.D. Boyes, MRS Bulletin 3 (1995) 17; in: Proc. Mater. Res. Soc., Vol. 404, Mat. Res. Soc. Publ. (1996).
27. P.L. Gai and E.D. Boyes, in: In-Situ Microscopy in Materials Research (Kluwer Academic, Dordrecht, 1997).
28. E.D. Boyes and P.L. Gai, Ultramicroscopy (Elsevier) 67 (1997) 219.
29. (a) L. Diebolt et al., in: Proc. Mater. Res. Soc., Pittsburgh, 1995/1996 p. 404;
30. (b) J. Drucker, R. Sharma, K. Weiss, B. Ramakrishna and J. Kouvetakis, MRS 404 (1996).
31. A. Burden et al., J. Cryst. Growth (1996) 158.
32. N.M. Rodriguez, J. Mater. Res. 8 (1993) 3233.
33. R.C. Doole and E. Birhell, Ultramicroscopy 56 (1994) 172.
34. P. Crozier and R. Sharma, in: Proc. 56th Micr. Soc. Am. (Springer, Berlin, 1998) p. 748.
35. S. Tauster, S. Fung and J.L. Garten, J. Am. Chem. Soc. 100 (1978) 170.
36. M.G. Sanchez and J. Gazquez, J. Catal. 104 (1987) 120.
37. E. Bordes, Catal. Today 1 (1987) 499.
38. G. Centi, ed., Catal. Today 16 (1993) 1.
39. P.L. Gai and K. Kourtakis, Science 267 (1995) 647.
40. C.C. Torardi and J. Calabrese, Inorg. Chem. 23 (1984) 1308.
41. Yu.E. Gorbunova and S.A. Linde, Sov. Phys. Dockl. (Eng. Trans.) 24 (1979) 138.
42. P.L. Gai and C.C. Torardi, in: Proc. MRS, Vol. 404, Mater. Res. Soc. Publ. (1996) p. 61.
43. P.L. Gai, K. Kourtakis, D.R. Coulson and G. Sonnichsen, J. Phys. Chem. B 101 (1997) 9916.
44. P.L. Gai, Acta Crystallogr. B 53 (1997) 346.
45. H.W. Kroto, J. Heath, S.C. Obrien, R.F. Curl and R.E. Smalley, Nature (London) 318 (1987) 162.
46. S. Iijima, Nature (London) 354 (1991) 56.
47. M.S. Dresselhaus et al., Fullerenes and Nanotubes (Academic Press, New York, 1996).
48. A. Thess and R.E. Smalley et al., Science 373 (1996) 483.
49. G.D. Danilatos, in: In-Situ Microscopy in Materials Research, ed. P.L. Gai (Kluwer Academic, Dordrecht, 1997).
50. E.D. Boyes, in: Proc. Internat. EM Congr., ICEM 13, Paris, France, 1994.
51. K. Yagi et al., Thin Solid Films 126 (1985) 95.
52. E. Bauer, In-Situ Microscopy in Materials Research (Kluwer Academic, Dordrecht, 1997).