Determination of the anisotropic dielectric function for wurtzite AlN and GaN by spectroscopic ellipsometry

Journal of Applied Physics

Volumn 94, Issue 1, 2003, Pages 307-312

  Shokhovets, S ^a   Goldhahn, R ^a   Gobsch, G ^a   Piekh, S ^b   Lantier, R ^c   Rizzi, A ^c   Lebedev, V ^d   Richter, W ^d  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b BELARUSIAN NATIONAL TECHNICAL UNIVERSITY   (Belarus)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; ENERGY GAP; GALLIUM NITRIDE; PERMITTIVITY; PHOTONS;

SPECTROSCOPIC ELLIPSOMETRY;

ALUMINUM NITRIDE;

EID: 0041840543     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1582369     Document Type: Article

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