Dispersion properties of aluminum nitride as measured by an optical waveguide technique

Applied Physics Letters

Volumn 70, Issue 24, 1997, Pages 3206-3208

  Tang, Xiao ^a   Yuan, Yifang ^a,b   Wongchotigul, Kobchat ^a   Spencer, Michael G ^a  

^a Howard University   (United States)

^b EAST CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL FIBER COUPLING; OPTICAL VARIABLES MEASUREMENT; PRISMS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; REFRACTIVE INDEX; SEMICONDUCTING ALUMINUM COMPOUNDS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CATHODOLUMINESCENCE MEASUREMENTS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION SYSTEM; SECONDARY ION MASS SPECTROSCOPY; WAVEGUIDE MEASUREMENTS;

OPTICAL WAVEGUIDES;

EID: 0031168380     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119127     Document Type: Article

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