Reflectivity study of hexagonal GaN films grown on GaAs: Surface roughness, interface layer, and refractive index

Journal of Applied Physics

Volumn 84, Issue 3, 1998, Pages 1561-1566

  Shokhovets, S ^a   Goldhahn, R ^a   Cimalla, V ^a   Cheng, T S ^b   Foxon, C T ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000381039     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368223     Document Type: Article

References (21)

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