Ordinary and extraordinary refractive indices for AlxGa1-xN epitaxial layers

Applied Physics Letters

Volumn 75, Issue 1, 1999, Pages 67-69

  Bergmann, M J ^a   Özgür, Ü ^a   Casey Jr , H C ^a   Everitt, H O ^a,c   Muth, J F ^b  

^a DUKE UNIVERSITY   (United States)

^b North Carolina State University   (United States)

^c U S ARMY RESEARCH OFFICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTROMAGNETIC DISPERSION; EPITAXIAL GROWTH; FUNCTIONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MULTILAYERS; OPTICAL WAVEGUIDES; POLYNOMIALS; REFRACTIVE INDEX; SAPPHIRE; SUBSTRATES;

EXTRAORDINARY INDICES; SELLMEIER DISPERSIONS;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0345669113     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124278     Document Type: Article

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