Formation and observation of ferroelectric domains in PbZr1-xTixO3 (PZT) thin films using atomic force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3675, Issue , 1999, Pages 94-102

  Shin, Hyunjung ^a   Lee, Kyongmi ^a   Lim, Geunbae ^a   Jeon, Jong Up ^a   Pak, Y Eugene ^a   Hong, Seungbum ^a   No, Kwangsoo ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; FERROELECTRIC MATERIALS; FERROELECTRICITY; INTELLIGENT MATERIALS; LEAD COMPOUNDS; POLARIZATION; SOL-GELS; STRESS RELAXATION; THIN FILMS;

LEAD ZIRCONATE TITANATE; SPONTANEOUS REVERSAL POLARIZATION;

DIELECTRIC FILMS;

EID: 0032648461     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (26)