Piezoelectric measurements with atomic force microscopy

Applied Physics Letters

Volumn 73, Issue 26, 1998, Pages 3851-3853

  Christman, J A ^a   Woolcott, R R ^a   Kingon, A I ^a   Nemanich, R J ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000534197     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122914     Document Type: Article

References (12)

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