메뉴 건너뛰기




Volumn 60, Issue 23, 1999, Pages 16198-16204

Probing domains at the nanometer scale in piezoelectric thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000158097     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.16198     Document Type: Article
Times cited : (75)

References (19)
  • 3
    • 0000195589 scopus 로고    scopus 로고
    • ) for a good overview of dielectric properties.
    • See, for instance, D. Damjanovic, Rep. Prog. Phys. 61, 1267 (1998) for a good overview of dielectric properties.
    • (1998) Rep. Prog. Phys. , vol.61 , pp. 1267
    • Damjanovic, D.1
  • 13
    • 85037904621 scopus 로고    scopus 로고
    • Nanosensors GmbH, Wacholderweg 8, D-71134, Aldlingen, Germany.
    • Nanosensors GmbH, Wacholderweg 8, D-71134, Aldlingen, Germany.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.