An application of polarized domains in ferroelectric thin films using scanning probe microscope

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 47, Issue 4, 2000, Pages 801-807

  Shin, Ilyunjung ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; IMAGE ANALYSIS; LIGHT POLARIZATION; THIN FILMS;

FERROELECTRIC THIN FILMS; SCANNING PROBE MICROSCOPY (SPM);

FERROELECTRIC MATERIALS;

EID: 0034224576     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.852061     Document Type: Article

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