Tip-sample interactions in scanning force microscopy using the frequency-modulation technique: Experiments and computer simulation

Europhysics Letters

Volumn 39, Issue 2, 1997, Pages 153-158

  Gotsmann, B ^a   Kruger D ^a   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040236785     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1997-00542-5     Document Type: Article

References (13)

1. GIESSIBL F. J., Science, 267 (1995) 68.
2. GÜTTNER P., J. Vac. Sci. Technol. B, 14 (1996) 2428.
3. LÜTHI R., MEYER E., BAMMERLIN M., BARATOFF A., LEHMANN T., HOWALD L., GERBER CH. and GÜNTHERODT H.-J., Z. Phys. B, 100 (1996) 165.
4. BAMMERLIN M., LÜTHI R., BARATOFF A., LÜ J., GUGGISBERG M., GERBER CH., HOWALD L. and GUNTHERODT H.-J., Probe Microsc., 1 (1997) 1.
5. ALBRECHT T. R., GRÜTTER P., HORNE D. and RUGAR D., J. Appl. Phys., 69 (1991) 668.
6. ANCZYKOWSKI B., KRÜGER D. and FUCHS H., Phys. Rev. B, 53 (1996) 485; ACZYKOWSKI B., KRÜGER D., BABCOCK K. L. and FUCHS H., Ultramicrosc., 66 (1996) 251.
7. ANCZYKOWSKI B., KRÜGER D. and FUCHS H., Phys. Rev. B, 53 (1996) 485; ACZYKOWSKI B., KRÜGER D., BABCOCK K. L. and FUCHS H., Ultramicrosc., 66 (1996) 251.
8. Omicron UHV-AFM/STM, described in [2] and references therein.
9. Nanosensors GmbH, Wetzlar, Germany.
10. KITAMURA S. and IWATSUKI M., Jpn. J. Appl. Phys., 34 (1995) L145.
11. GLEYZES P., KUO P. K. and BOCCARA A. C., Appl. Phys. Lett., 58 (1991) 2989.
12. VERLET L., Phys. Rev., 159 (1967) 98.
13. HIRSEKORN S., RABE U. and ARNOLD W., Europhys. News, 27 (1996) 92.