The contrast mechanism for true atomic resolution by AFM in non-contact mode: Quasi-non-contact mode?

Surface Science

Volumn 381, Issue 1, 1997, Pages

  Sokolov, I Yu ^a   Henderson, G S ^a   Wicks, F J ^a,b  

^a UNIVERSITY OF TORONTO   (Canada)

^b DEPARTMENT OF NATURAL HISTORY   (Canada)

Author keywords

Atom solid interactions; Atomic force microscopy; Computer simulations; Surface defects

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; COMPUTER SIMULATION; POINT DEFECTS;

INTERATOMIC INTERACTIONS;

SURFACE PHENOMENA;

EID: 0031166523     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00058-7     Document Type: Article

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