Liquid-film-mediated scanning thermal microscopy of a magnetoresistive reading head

Microscale Thermophysical Engineering

Volumn 1, Issue 4, 1997, Pages 333-345

  Luo, K ^a   Lederman, M ^b   Majumdar, Arun ^c  

^a Anadigics Inc   (United States)

^b WESTERN DIGITAL CORPORATION   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041171276     PISSN: 10893954     EISSN: 10893954     Source Type: Journal    
DOI: 10.1080/108939597200188     Document Type: Article

References (16)

1. H. N. Bertram. Theory of Magnetic Recording, Cambridge University Press, Cambridge. UK. 1994.
2. D. Hannon and M. Krounbi. Allicat Magnetoresistive Head Design and Performance. IEEE Trans. Mag., vol. 30, pp. 298-302, 1994.
3. M. Y. Huang, V. Riedlin, T. Tran, Optimizing Bias Current for Shielding Soft-Adjacent-Layer Magnetoresistive Read Head Using a Track Profile Model. IEEE Trans. Mag., vol. 31. pp. 3075-3077, 1995.
4. S. Heng and W. Z. Black. Temperature Mapping of Localized Hot Spots on Microelectronic Chip Surfaces, ASME J. Electron. Pack., vol. 113. pp. 286-293, 1991.
5. T. Q. Qiu, C. P. Grigoropoulos, and C. L. Tien. Novel Technique for Noncontact and Microscale Temperature Measurements, Exp. Heat Transfer, vol. 6, pp. 231-234. 1993.
6. K. Goodson, O. W. Kading, M. Rosier, and R. Zachai, Experimental Investigation of Thermal Conduction Normal to Diamond-Silicon Boundaries, J. Appl. Phys., vol. 77, pp. 1385-1392, 1995.
7. R. Ostermeir, K. Brunner, G. Abstreiter, and W. Weber. Temperature Distribution in Si-MOSFETs Studied by Micro-Raman Spectroscopy. IEEE Trans. Electronic Dev., vol. 39. pp. 858-863, 1992.
8. K. Goodson and M. Asheghi, Near-Field Optical Thermometry. Mircoscale Thermophys. Eng., vol. 1, pp. 225-235, 1997.
9. K. Luo, Z. Shi, J. Varesi, and A. Majumdar. Sensor Nanofabrication. Performance, and Conduction Mechanisms in Scanning Thermal Microscopy. J. Vacuum Sci. Technol. B. vol. 15, pp. 349-360, 1997.
10. A. Majumdar, J. P. Carrejo, and J. Lai. Thermal Imaging Using the Atomic Force Microscope. Appl. Phys. Lett., vol. 62, pp. 2501-2503, 1993.
11. R. J. Pylkki, P. J. Moyer, and P. E. West, Scanning Near-Field Optical Microscope and Scanning Thermal Microscope. Jpn. J. Appl. Phys. Part I. vol. 33. pp. 3785-3790, 1994.
12. O. Nakabeppu, M. Chandrachood, Y. Wu, J. Lai, and A. Majumdar, Scanning Thermal Imaging Microscopy Using Compostive Cantilever Probes, Appl. Phys. Lett., vol. 66, pp. 694-696. 1995.
13. A. Majumdar, J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi, Thermal Imaging by Atomic Force Microscopy Using Cantilever Thermocouple Probes, Rev. Sci. Instrum., vol. 66, pp. 3584-3592, 1995.
14. K. Luo, Z. Shi, J. Lai, and A. Majumdar. Nanofabrication of Sensors for Scanning Multiprobe Microscopy, Appl. Phys. Lett., vol. 68. pp. 325-327, 1996.
15. F. Incropera and D. P. DeWitt, Fundamentals of Heat and Mass Transfer, 3d ed., John Wiley, New York, 1990.
16. J. N. Israelachvili, Intermolecular and Surface Forces, 2d ed., Academic Press, San Diego, CA. 1992.