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Volumn 42, Issue 6, 1995, Pages 1772-1779

Application of a Diffusion Model to SEE Cross Sections of Modem Devices

Author keywords

[No Author keywords available]

Indexed keywords

HEURISTIC METHODS; IONS; MATHEMATICAL MODELS; PARTICLE ACCELERATORS;

EID: 0029535998     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.488778     Document Type: Article
Times cited : (32)

References (12)
  • 1
    • 0001671884 scopus 로고
    • Rate prediction for single event effects - A critique
    • December
    • E.L. Petersen, J C. Pickel, J.H. Adams, Jr, and E.C. Smith, “Rate prediction for single event effects - A critique”, IEEE Trans. Nuc Sci., Vol. 39, page 1577 (December 1992)
    • (1992) IEEE Trans. Nuc Sci. , vol.39 , pp. 1577
    • Petersen, E.L.1    Pickel, J.C.2    Adams, J.H.3    Smith, E.C.4
  • 4
    • 84904466214 scopus 로고
    • Satellite Anomalies from Galactic Cosmic Rays
    • December
    • D. Binder, E.C. Smith and A.B. Holman, “Satellite Anomalies from Galactic Cosmic Rays”, IEEE Trans. Nuc. Sci., vol. NS-22, page 2675 (December 1975)
    • (1975) IEEE Trans. Nuc. Sci. , vol.NS-22 , pp. 2675
    • Binder, D.1    Smith, E.C.2    Holman, A.B.3
  • 5
    • 84937995134 scopus 로고
    • Cosmic-Ray Induced Errors in MOS RAMs
    • April
    • J.C. Pickel and J.T. Blandford, Jr., “Cosmic-Ray Induced Errors in MOS RAMs”, IEEE Trans. Nuc. Sci., vol. NS-27, page 1006 (April 1980)
    • (1980) IEEE Trans. Nuc. Sci. , vol.NS-27 , pp. 1006
    • Pickel, J.C.1    Blandford, J.T.2
  • 7
    • 0018547168 scopus 로고
    • Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices
    • November
    • S. Kirkpatrick, “Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices”, IEEE Trans. Electron Devices, vol. ED-26, page 1742 (November 1979)
    • (1979) IEEE Trans. Electron Devices , vol.ED-26 , pp. 1742
    • Kirkpatrick, S.1
  • 8
    • 0026139259 scopus 로고
    • Charge Collected by Diffusion from an Ion Track under Mixed Boundary Conditions
    • April
    • L.D. Edmonds, “Charge Collected by Diffusion from an Ion Track under Mixed Boundary Conditions”, IEEE Trans. Nuc. Sci., vol. 38, page 834 (April 1991)
    • (1991) IEEE Trans. Nuc. Sci. , vol.38 , pp. 834
    • Edmonds, L.D.1
  • 10
    • 0025682739 scopus 로고
    • Latchup in CMOS from Single Particles
    • December
    • A.H. Johnson and B.W. Hughlock, “Latchup in CMOS from Single Particles”, IEEE Trans. Nuc. Sci., vol. 37, page 1886 (December 1990)
    • (1990) IEEE Trans. Nuc. Sci. , vol.37 , pp. 1886
    • Johnson, A.H.1    Hughlock, B.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.