Single-event upset (SEU) model verification and threshold determination using heavy ions in a bipolar static RAM

IEEE Transactions on Nuclear Science

Volumn 32, Issue 6, 1985, Pages 4164-4169

  Thieberger, P ^b   Wegner, H E ^b   Soli, G A ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957243023     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334087     Document Type: Article

References (6)

1. J.A. Zoutendyk, “Modeling of Single-Event Upset in Bipolar Integrated Circuits,” IEEE Trans. Nucl. Sci., Vol. NS-30, No. 6, pp. 4540–4545, December 1983.
2. J.A. Zoutendyk, “Accelerators for Critical Experiments Involving Single-Particle Upset in Solid-State Microcircuits,” Nucl. Instr. and Meth., Vol. B10/11, pp. 757–762, June 1985.
3. J.A. Zoutendyk, C.J. Malone, and L.S. Smith, “Experimental Determination of Single-Event Upset as a Function of Collected Charge in Bipolar Integrated Circuits,” IEEE Trans. Nucl.Sci., Vol. NS-31, No. 6, pp. 1167–1174, December 1984.
4. J.F. Ziegler, The Stopping and Range of Ions in Matter, Vol. 5, Handbook of Stopping Cross-sections for Energetic Ions in All Elements. New York: Pergamon Press, 1980.
5. P. Thieberger, “The Brookhaven Double MP Facility: Recent Developments and Plans for the Future,” Nucl. Instr. and Meth., Vol. 220, No. 1, pp. 45–53, February 15, 1984.
6. R. Middleton, “A Survey of Negative Ions from a Cesium Sputter Source,” Nucl. Instr. and Meth., Vol. 144, pp. 373–399, August 1977.