Soft errors induced by energetic protons

IEEE Transactions on Nuclear Science

Volumn 26, Issue 6, 1979, Pages 4905-4910

  Wyatt, R C ^a   McNulty, P J ^a   Toumbas, P ^a   Rothwell, P L ^b   Filz, R C ^b  

^a CLARKSON UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROTONS; RADIATION EFFECTS;

DATA STORAGE, DIGITAL;

EID: 0018586797     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1979.4330248     Document Type: Article

References (7)

1. D.Binder, E.C.Smith, and A.B. Holeman, IEEE Trans Nucl Sci NS-22, 2675 (1975).
2. T.C. May and M.H. Woods, IEEE Trans in Proc 1978 Int Reliability Physics Symp (IEEE Catalogue No. 78CH1294-Elec Design 11 37 (1978). 8 PHY) pp 33; IEEE trans on Electronic Devices ED-26, 21 (1979)
3. J.C. Pickel and J.T. Blanford Jr. IEEE Trans. on Nucl. Sci. NS-25, 1166 1978
4. D.S. Yaney, J.T. Nelson, L.L. Vanskike IEEE Trans. on Electron Devices ED-26, 10 (1979)
5. J.M. Bradford IEEE Trans Nucl Sci NS-25, 1144 (1978); U.S.Air Force Report RADC-TR-78-109 (1978)
6. G.B. Farrell and P.J. McNulty, and P.L. Rothwell in preparation.
7. T.C. May, private communication.