Single event upset of dynamic rams by neutrons and protons

IEEE Transactions on Nuclear Science

Volumn 26, Issue 6, 1979, Pages 5048-5052

  Guenzer, C S ^a   Wolicki, E A ^a   Alias, R G ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRONS; PROTONS; RADIATION EFFECTS;

DATA STORAGE, DIGITAL;

EID: 0018619487     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1979.4330270     Document Type: Article

References (12)

1. D. Binder, E.C. Smith and A.B. Holman, “Satellite Anomalies from Galactic Cosmic Rays,” IEEE Trans. Nucl. Sci., NS-22, 2675–2680 (1975).
2. J.C. Pickel and J.T. Blandford, “Cosmic Ray Induced Errors in MOS Memory Cell,” IEEE Trans. Nucl. Sci., NS-25, 1166–1171 (1978).
3. J.N. Bradford, “Heavy Ion Radiation Effects in VLSI,” RADC-TR-78-109 (May 1978).
4. J.F. Ziegler and W.A. Lanford, “The Effect of Cosmic Rays on Computer Memories,” to be published, Science.
5. T.C. May and M.H. Woods, “Alpha-Particle-Induced Soft Errors in Dynamic Memories,” IEEE Trans. Electron Devices, ED-26, 2–9 (1979).
6. D.S. Yaney, J.T. Nelson and L.L. Vanskike, “Alpha-Particle Tracks in Silicon and their Effect on Dynamic MOS RAM Reliability,” IEEE Trans. Electron Devices, ED-26, 10–16 (1979).
7. L.C. Northcliffe and R.F. Schilling, “Range and Stopping Power Tables for Heavy Ions,” Nuclear Data: Tables, Section A, 7, 233–463 (1970).
8. “Neutron Cross Sections: Vol. II, Curves ” 3rd Ed., eds. D. Garber and R. Kinsey, BNL-325 (1976).
9. E.L. Petersen, to be published.
10. V.L. Rideout, “One-Device Cells for Dynamic Random-Access Memories: A Tutorial,” IEEE Trans. Electron Dev. ED-26, 839–852 (1979).
11. C.C. Carosella, “Shielding of Solar Cells Against Van Allen Belt Protons,” J. of Spacecraft and Rockets, 5, 878–880 (1968).
12. C.C. Huang, A.J. Lewandowski, M.J.Nelson and S.R. Orr, “Component/System Correlation of Alpha Induced Dynamic RAM Soft Failure Rates,” 1979 Intl. Rel. Phys. Symp., to be pub. IEEE Trans. Elec. Dev.