Accurate wafer-level measurement of BSD protection device turn-on using a modified very fast transmission-line pulse system

IEEE Transactions on Device and Materials Reliability

Volumn 1, Issue 2, 2001, Pages 95-103

  Juliano, Patrick A ^a   Rosenbaum, Elyse ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

COM; Electrostatic discharge; LVTSCR; TLP; VFTLP

Indexed keywords

EID: 0008450996     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/7298.956702     Document Type: Article

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