Fast turn-on of an NMOS ESD protection transistor; measurements and simulations

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1994, Pages 266-272

  Luchies, J R M ^a   de Kort, C G C M ^a   Verweij, J F ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC FIELD EFFECTS; ELECTROOPTICAL EFFECTS; ELECTROSTATICS; MOS DEVICES; SEMICONDUCTOR DEVICE MODELS; STRESSES; TRANSIENTS; VOLTAGE MEASUREMENT;

ELECTROOPTIC SAMPLING; TRANSIENT TURN ON;

BIPOLAR TRANSISTORS;

EID: 0028734222     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)