ESD PROTECTION STRUCTURES TO SURVIVE THE CHARGED DEVICE MODEL (CDM).

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1987, Pages 186-191

  Avery, L R ^a  

^a SARNOFF CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; INTEGRATED CIRCUIT TESTING;

CHARGED DEVICE MODEL (CDM); DISCHARGE CURRENT; DISCHARGE PATH; ESD PROTECTION; LARGE CAPACITANCE; SERIES RESISTANCE;

ELECTRONIC EQUIPMENT;

EID: 0023547417     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)