Ultra low impedance transmission line tester

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 311-319

  Chu, C Y ^a   Worley, E R ^a  

^a Rockwell Semiconductor Systems ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC IMPEDANCE; ELECTROSTATICS;

TRANSMISSION LINE PULSING (TLP) TECHNIQUES; TRANSMISSION LINE TESTERS;

ELECTRIC LINES;

EID: 0032308918     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)