ESD: Design for IC chip quality and reliability

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2000-January, Issue , 2000, Pages 251-259

  Duvvury, Charvaka ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; INTEGRATED CIRCUIT DESIGN;

ADVANCED PROCESS; ON-CHIP PROTECTION; PACKAGE TECHNOLOGIES; PROTECTION DESIGNS; PROTECTION METHODS; RELIABILITY REQUIREMENTS; SIMULATION AND MODELING; THERMAL DAMAGE;

DESIGN;

EID: 0002014122     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2000.838880     Document Type: Conference Paper

References (28)

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