Process-tolerant input protection circuit for advanced CMOS processes

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1988, Pages 201-205

  Rountree, R N ^a   Duvvury, C ^a   Maki, T ^a   Stiegler, H ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES--STATIC ELECTRICITY; ELECTRONIC CIRCUITS, RECTIFYING--APPLICATIONS; ELECTROSTATICS;

ADVANCED CMOS PROCESSES; ELECTROSTATIC DISCHARGE (ESD); FAILURE THRESHOLD; LATERAL SILICON CONTROLLED RECTIFIER (LSCR); PROCESS-TOLERANT INPUT PROTECTION CIRCUIT;

SEMICONDUCTOR DEVICES;

EID: 0024176693     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)