CMOS-on-SOI ESD protection networks

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1996, Pages 291-301

  Voldman, S ^a   Schulz, R ^a   Howard, J ^a   Gross, V ^a   Wu, S ^a   Yapsir, A ^a   Sadana, D ^a   Hovel, H ^a   Walker, J ^a   Assaderaghi, F ^a   Chen, B ^a   Sun, J Y C ^a   Shahidi, G ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTROSTATICS; SILICON ON INSULATOR TECHNOLOGY;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION NETWORKS; FLOATING GATE EFFECTS; HUMAN BODY MODEL (HBM);

ELECTRIC DISCHARGES;

EID: 0030386832     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)