MODELING THE EFFECTS OF NARROW IMPULSIVE OVERSTRESS ON CAPACITIVE TEST STRUCTURES.

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1985, Pages 84-91

  Bridgwood, Michael A ^a   Kelley, Raymond H ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS - TESTING; ELECTRIC BREAKDOWN;

FIELD-INDUCED BREAKDOWN; FIRST ORDER MODELS; N-TYPE WAFERS; NARROW IMPULSIVE OVERSTRESS; SECOND BREAKDOWN; SQUARE IMPULSE;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0022264916     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)