Advanced CMOS protection device trigger mechanisms during CDM

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1995, Pages 162-174

  Duvvury, Charvaka ^a   Amerasekera, Ajith ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROSTATICS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MOS DEVICES; RELIABILITY; SAFETY DEVICES; SEMICONDUCTOR DEVICE MODELS;

CHARGE DEVICE MODEL; ELECTROSTATIC DISCHARGE; PROTECTION DEVICES;

CMOS INTEGRATED CIRCUITS;

EID: 0029506125     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1995.478281     Document Type: Conference Paper

References (15)